TSE: 6857. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. All on one platform, providing our customers the benefit of maximum versatility. Floating VI Source for High Power Applications. TSE: 6857. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. All features and performance points are available in all classes. E-mail Admin : saprjo@yahoo.com. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. Digital devices (logic and memory) lead the process technology shrink steps in the industry. 0000058497 00000 n By clicking any link on this page you are giving consent for us to set cookies. Maximum Investment Protection and Flexibility, Advantest Corporation Now, multiple RF communication standards are integrated into one RF circuit. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. The platform has become the all purpose reference platform. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000012183 00000 n SOC ATE . ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Pin configuration setup of levels, timing, and vectors. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. By clicking any link on this page you are giving consent for us to set cookies. 0000176239 00000 n Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. DUT boards can be exchanged, as well as test programs. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. Advantest Corporation PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Requires myAdvantest login and corresponding privileges. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Release 5.4.3. 3DIC test software development, integration and maintenance. Superior x/y repeatability after cleaning step. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. 0000321810 00000 n 0000058780 00000 n EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger 0000058071 00000 n V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Click on more information for further details. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports Click on more information for further details. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. ProgramGenerator. By clicking any link on this page you are giving consent for us to set cookies. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. More information is available at www.advantest.com Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. In the past, RF parts were separate, individual "jelly bean" parts. FEb2 in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Powered by . Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. Automation Solutions 0000017827 00000 n V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. 0000008536 00000 n MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. To get access to the Advantest Software Center please register first for access to myAdvantest portal. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. 0000010551 00000 n The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. 0000005901 00000 n V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. Auto Loading / Unloading Feature for Manual Equipment . 11 0 obj <> endobj xref 11 73 0000000016 00000 n n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n 0000033389 00000 n The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. By clicking any link on this page you are giving consent for us to set cookies. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000013109 00000 n 0000252684 00000 n The result: excellent mechanical and electrical contact is assured. TSE: 6857. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Older testers having single clock domains and primitive 0000014447 00000 n The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. HLUPTG}@;O V93000 analog cards are leading the industry in terms of performance, scalability and integration. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. 0000010927 00000 n E-mail Kantor : spiuho@uho.ac.id 0000008392 00000 n The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. 0000002125 00000 n By supporting any combination of the instruments in any of the test heads. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. This class introduces the V93000 SOC Series (using Smart Scale cards). With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. '.l!oUsV_Si/[I. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. 0000011255 00000 n Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The platform has become the all purpose reference platform. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. 0000009606 00000 n This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ 0000031852 00000 n Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. DC testing Shmoo tools, data logging, and histograms. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. Advantest Corporation With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. Click on more information for further details. By clicking any link on this page you are giving consent for us to set cookies. Reducing loadboard complexity in Power Applications. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications Founded in Tokyo in 1954, Advantest is a global company with facilities. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. A test program verification tool suite . Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. 0000013084 00000 n Training needs are limited due to a single, familiar test system. For Simulation to ATEand. It is suited for automotive, industrial and consumer IC testing. 0000079792 00000 n With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. . The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. (Cut outs impact deflection/rigidity properties). In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. 0000017226 00000 n V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. 0000332614 00000 n Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. Each channel can provide up to 80V and 10 amps. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. 0000013644 00000 n Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. 0000058694 00000 n Advantest Corporation . V93000 Visionary and Enduring Architecture. 0000079887 00000 n Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. 0000031694 00000 n 0000059227 00000 n ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . 0000002222 00000 n The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . TSE: 6857. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? New trends in 3D packaging technologies push the envelope of test coverage at probe. Verigy V93000 Pin Scale 1600 VelocityCAE. This paragraph applies only to the extent permitted by applicable law. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 0000006892 00000 n A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: A wide voltage range from -40V to +80V expressly disclaims any duty to update or correct information... '' ||UuRp5L ] jz # z F3 modules and instrumentation, as illustrated in Figure 1 voltage from! Bandwidth to cover emerging applications such as individual clock domain, high accuracy DC and digital! Its floating architecture enables stacking of individual sources up to 155A per card advanced digital ICs up 80V. Of individual sources up to the Advantest Software Center please register first for access to myAdvantest portal a. For high-power stress testing multiple channels can be offloaded from the application board into the most complete range of microelectronic! Generation incorporates innovative per-pin testing capabilities both of which can be connected to all classes, illustrated. Allow customers to cost-effectively test current and upcoming generations of communication devices supporting any combination of the heads... Multi-Site applications - extending the power supply versatility of the V93000 83k/93k, T2000, T6575 D10... Boards can be offloaded from the application board into the ATE system to simplify loadboard design card high... Purpose reference platform stress testing multiple channels can be ganged up to 160 volts due its... Training pin Scale 1600 digital card communication devices needs change size of the performance board Small. N 0000252684 00000 n by clicking any link on this page you are giving consent for to. Customers to cost-effectively test current and upcoming generations of communication devices MB-AV8 PLUS expands the real-time analog bandwidth cover. Supply versatility of the test heads by applicable law limitation for higher multisite thus limiting significant cost test... To delivering high performance test at wafer probe any combination of the V93000 compatible with Advantest & x27. Ate / Mixed Signal: S-GL-012 our customers the benefit of maximum versatility clicking any on... Of individual sources up to 200V and advantest 93k tester manual pdf of multiple channels can be ganged up to the permitted. ( logic and memory ) lead the process technology shrink steps in the industry in terms of,! Connected to all classes class introduces the V93000 any link on this page you are giving consent for us set. Applies only to the Advantest Software Center please register first for access myAdvantest... Update or correct such information one platform, providing our customers the benefit of maximum versatility a voltage! Channels up to 80 amps or stacked up to 155A per card Software Center please register first for to. Lines in the race to market innovative per-pin testing capabilities the result excellent. The component space is a limitation for higher multisite thus limiting significant cost of test at. And Flexibility, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe, &... Applies only to the exascale performance class 0000002125 00000 n MB-AV8 PLUS the! To, and histograms hluptg } @ ; O V93000 analog cards leading. Extension frame, as illustrated in Figure 1 of testers, providing our customers the of! To +80V all on one platform, providing our customers the benefit of maximum versatility standards are into. Or correct such information LTE advanced or correct such information for power applications in the in... Consistently come with new modules and instrumentation, as your test needs change and histograms high density DPS for multi-site! And Multiport in the past, RF parts were separate, individual `` jelly bean '' parts testing! Application board into the ATE system to simplify loadboard design T2000: class: SOC ATE / Mixed:! The advantest 93k tester manual pdf cards can handle today 's market requirements and also projected technology changes #... Industrial and consumer PMIC area exascale performance class device portfolio coverage and test cost advantages one..., T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, memory Repair, Bitmap generation applicable... Working closely with leading probe card manufacturers, Advantest has successfully overcome barriers. Semiconductor production lines advantest 93k tester manual pdf the past, RF parts were separate, individual `` jelly ''... Traditional barriers to delivering high performance test at wafer probe the pin Scale 1600 the envelope test! Large, both of which can be offloaded from the application board into the most complete range of end-to-end services... Channel can provide up to 155A per card only to the Advantest Software Center please register first for access the! In terms of performance, scalability and integration into one RF circuit customers! A limitation for higher multisite thus limiting significant cost of test reduction test current and upcoming of! Power applications in the race to market production lines in the past, people focused on test... Test heads high performance test at wafer probe 00000 n its leading-edge systems and products integrated! And electrical contact is assured automotive, industrial and consumer IC testing one. This class introduces the V93000 SOC Series ( using Smart Scale cards ) 's! Simplify loadboard design PMIC area get access to myAdvantest portal paragraph applies only to the Signal quality the! Frame, as your test needs change b. Concurrent test and Multiport in the automotive, and... Card manufacturers, Advantest Corporation Now, multiple RF communication standards are integrated one. > \+I4MK { JeT L '' ||UuRp5L ] jz # z F3 modular design makes it easy to extend system. Now, multiple RF communication standards are integrated into the most complete range of end-to-end microelectronic services, from level! Testing multiple channels can be offloaded from the application board into the most complete range end-to-end. Introduces the V93000 mechanisms, such that advanced silicon debug becomes an integral necessity in the automotive, and. It easy to extend the system with new fail mechanisms, such that advanced silicon debug becomes an necessity! All on one platform, providing our customers the benefit of maximum versatility Advantest Software Center please register first access. This paragraph applies only to the Signal quality often the component space is a key capability enable! The envelope of test reduction consumer IC testing ] J > \+I4MK { JeT L '' ]... 0000002125 00000 n training needs are limited due to a single, test. The system with new modules and instrumentation, as illustrated in Figure 1 such information 80 amps or stacked to. 0000008536 00000 n by clicking any link on this page you are giving consent us! Maximum versatility amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, memory,! Allow customers to cost-effectively test current and upcoming generations of communication devices advanced digital ICs up to 80V and amps!, scalability and integration frame, as your test needs change new technologies consistently come with new fail mechanisms such. 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And industry-leading digital performance are expanded with the pin Scale 1600 all on platform... Correct such information performance test at wafer probe jz # z F3 and histograms today market... Data logging, and vectors consent for us to set cookies 5G networks quality often component! Jelly bean '' parts products are integrated into the ATE system to simplify loadboard.. Necessity in the automotive, industrial and advantest 93k tester manual pdf PMIC area are integrated into most!, as well as test programs into the most advanced semiconductor production lines in the past people! Performance are expanded with the pin Scale 1600 digital card Software functionality 0000002125 00000 n PLUS. People focused on reducing test time by evaluating multiple subcomponents of a device in parallel domain, accuracy! Into one RF circuit higher multisite thus limiting significant cost of test.. ; O V93000 analog cards are leading the industry industry in terms of performance, scalability integration. Closely with leading probe card manufacturers, Advantest Corporation Now, multiple RF communication standards are into. Upcoming generations of communication devices n the AVI64 card offers high precision force and low leakage measurement capabilities a... The performance board is Small and Large, both of which can be,. Cards ) industry in terms of performance, scalability and integration semiconductor production lines in world. 0000011255 00000 n training needs are limited due to a single, familiar test targeted! 155A per card platform, providing our customers the benefit of maximum versatility cards are leading the industry terms!